The 5th International Workshop of In situ Electron Microscopy highlights the latest advancements in in situ and in operando electron microscopy, where materials and processes are observed in real-time under controlled conditions at the atomic or nanoscale.
Experts from academia, industry, and research institutions will explore cutting-edge developments in transmission electron microscopy (TEM), scanning transmission electron microscopy (STEM), cryo-electron microscopy (cryo-EM), and their integration with in situ holders. Sessions will also cover advancements in electron spectroscopy, camera technologies, and machine learning applications.
Attendees will discuss how these techniques enable the study of dynamic phenomena like phase transformations, nanomaterial behavior, and chemical reactions, with broad applications in materials science, biology, chemistry, and physics. The event provides a platform for collaboration and innovation, driving forward the real-time analysis of materials at the atomic level.
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