Jordi Arbiol

Graduated in Physics at Universitat de Barcelona (UB) in 1997, where he also obtained his PhD (European Doctorate and PhD Extraordinary Award) in 2001 in the field of transmission electron microscopy (TEM) applied to nanostructured materials. He also worked as Assistant Professor at UB. In 2009 he was appointed as ICREA Professor and holds this position since then. From 2009 to 2015 he was Group Leader at Institut de Ciència de Materials de Barcelona, ICMAB-CSIC and Scientific Supervisor of its electron microscopy facilities. He was the President of the Spanish Microscopy Society (SME) from 2017 to 2021, was Vice-President from 2013 to 2017 and from 2009 to 2021 he was Member of its Executive Board. In 2018 he was elected as Member of the Executive Board of the International Federation of Societies for Microscopy (IFSM) (2019-2026).

Since 2015 he is the leader of the Group of Advanced Electron Nanoscopy at Institut Català de Nanociència i Nanotecnologia (ICN2), CSIC and BIST. He is Scientific Supervisor of the Electron Microscopy Area at ICN2 and BIST and the Scientific Coordinator of the Joint Electron Microscopy Center at ALBA Synchrotron (JEMCA). He has been one of the founder members of e-DREAM. Since 2023 he is Associate Editor of Nano Letters (American Chemical Society). He received the FWO Commemorative Medal (Flanders Research Foundation) in 2021, the 2018 BIST IGNITE Award and was awarded with the EU40 Materials Prize 2014 (E-MRS),  2014 EMS Outstanding Paper Award and listed in the Top 40 under 40 Power List (2014) by The Analytical Scientist. His group explores by means of electron microscopy and related spectroscopies the structure-properties relationships in nanomaterials for physical applications (photonics/plasmonics/phononics/electronics/quantum) adding AI-based methodologies for advanced automated data analysis (deep and machine learning). Another topic of interest is to understand the behavior of nanomaterials for energy and environmental applications down to the atomic scale and create in-situ and correlative methodologies combining electron microscopy, synchrotron and AI.